9 ECTS credits
270 h study time

Offer 1 with catalog number 4023284DNR for all students in the 1st semester at a (D) Master - preliminary level.

Semester
1st semester
Enrollment based on exam contract
Impossible
Grading method
Grading (scale from 0 to 20)
Can retake in second session
Yes
Taught in
English
Partnership Agreement
Under interuniversity agreement for degree program
Faculty
Faculty of Sciences and Bioengineering Sciences
Department
Faculty of Sciences and Bioengineering Sciences
External partners
Universiteit Gent
Educational team
Frank Vanhaecke (course titular)
Activities and contact hours

68 contact hours Lecture
Course Content

XRF/XAS

  • Interactions of X-rays with matter
  • Properties of conventional X-ray and synchrotron radiation (SR) sources
  • Quantitative methods in (SR)XRF analysis
  • X-ray Absorption Near Edge Structure (XANES) spectroscopy: theory, instrumentation and applications
  • Extended X-ray Absorption Fine Structure (EXAFS) spectroscopy: theory, instrumentation and applications
  • Scanning X-ray micro- and nano-analysis using synchrotron radiation
  • X-ray fluorescence microtomography: theory, instrumentation and applications
  • Confocal X-ray fluorescence imaging

ICP-MS

  • Introduction to the basic operation principles of the quadrupole filter, sector-field mass spectrometer and time-of-flight analyzer
  • Basic operation principles of ICP-mass spectrometry (ICP-MS)
  • Figures of merit of ICP-MS
  • Spectral interferences
  • Resolution of spectral interferences (physical & chemical resolution)
  • Non-spectral interferences
  • Calibration approaches (including isotope dilution)
  • Alternative sample introduction approaches (including aerosol desolvation, electrothermal vaporization, laser ablation)
  • Advanced ICP-MS applications
  • Ultra-trace elemental analysis
  • Elemental speciation (via hyphenation of HPLC, GC or CE with ICP-MS)
  • Spatially resolved analysis via LA-ICP-MS (including depth profiling analysis & elemental bio-imaging)
  • Single-event ICP-MS (single-particle and single-cell analysis)
  • Tracer experiments with enriched stable isotopes
  • Isotopic analysis of elements with radiogenic isotopes (Sr and Pb isotopic analysis for geochronological dating and provenance determination)
  • Multi-collector ICP-mass spectrometry (including a comparison with thermal ionization mass spectrometry – TIMS)

Surface Analysis

  1. General introduction on surfaces
  • Why study nanomaterials and surfaces?
  • Which information do we obtain?
  1. Methods based on electron interaction
  • Interaction of electrons with matter
  • Overview of techniques based on electron interaction
  • Transmission electron microscopy (TEM) and electron energy loss spectroscopy (EELS)
  • Scanning electron microscopy (SEM, SEM-EDS, SEM-WDS)
  • Auger electron spectroscopy (AES, SAM)
  1. Methods based on photon interaction
  • Interaction of photons with matter
  • Overview of techniques based on photon interaction
  • X-ray photoelectron spectroscopy (XPS)
  • X-ray excited optical luminescence (XEOL and XEOM)
  1. Methods based on ion interaction
  • Interactions of ions with matter
  • Overview of techniques based on ion interaction
  • Secondary ion mass spectrometry (SIMS)
  • Rutherford backscattering (RBS)
  • Particle Induced X-ray Emission (PIXE)
  1. Local probe methods
  •  
  • Scanning probe microscopy (SMP)
  • Scanning force microscopy (SFM)
  • Scanning tunneling microscopy (STM)
  • Atomic force microscopy (AFM)
Additional info

Introduction to the principles of various (synchrotron) X-ray excitation based spectroscopic, mass spectrometers, ICP-mass spectrometry and micro/nano-imaging and surface analysis techniques and their application in the fields of analytical chemistry, geo- and environmental science and materials chemistry. The appearance and origin of spectral and non-spectral interferences is covered and approaches for overcoming the bias thus introduced are discussed.

This course aims at understanding the principles of these techniques together with their capacities in various types of applications. The modules (1) XRF/XAS, (2) ICP-MS and (3) surface analysis are accessible as Advanced Topics in Chemistry.

References

Inductively Coupled Plasma Mass Spectrometry Handbook, ed. S.M. Nelms, Blackwell Publishing, 2005, ISBN 978-1-405-10916.

Inductively Coupled Plasma Spectrometry and its Applications, 2nd edition, ed. S.J. Hill, Blackwell Publishing, 2007, ISBN ISBN: 978-1-405-13594-8.

Isotopic Analysis – Fundamentals and Applications using ICP-MS, eds. F. Vanhaecke and P. Degryse, Wiley-VCH, 2012, ISBN: 978-3-527-65050-7.

Practical Guide to ICP-MS: A Tutorial for Beginners, 3rd edition, R. Thomas, 2013, CRC Press, ISBN 978-1-46655-543-3.

Sector Field Mass Spectrometry for Elemental and Isotopic Analysis, eds. T. Prohaska, J. Irrgeher, A. Zitek and N. Jakubowski, Royal Society of Chemistry, 2015, ISBN: 978-1-84973-392-2.

 

Learning Outcomes

general competencies

  • The student has an overview of the principles of the relevant X-ray spectroscopic and imaging methods, their application area, capabilities and limitations.
  • The student has gained a profound insight into the basic operating principles of several types of ICP-mass spectrometers and their capabilities and limitations.
  • The student has an overview of methods for the chemical characterization of nanomaterials and surfaces, their application area, capabilities and limitations.
  • The student is aware of and can explain the basic operating principles of analytical instrumentation for chemical surface analysis.
  • The student is capable of suggesting and appropriate analytical technique for a given chemical problem in this context.

Grading

The final grade is composed based on the following categories:
Written Exam determines 100% of the final mark.

Within the Written Exam category, the following assignments need to be completed:

  • written with a relative weight of 100 which comprises 100% of the final mark.

Additional info regarding evaluation

Written examination. The examination consists of overview questions, more detailed questions on specific course subjects and questions aiming at assessing the student´s understanding of the matter. Evaluate the understanding of basic concepts and being able to apply them in concrete problem cases. Exercises are also included in the theoretical exam

Written exam: 100% (each part (XRF/XAS, ICP-MS and Surface Analysis) contribute an equal share)

Allowed unsatisfactory mark
The supplementary Teaching and Examination Regulations of your faculty stipulate whether an allowed unsatisfactory mark for this programme unit is permitted.

Academic context

This offer is part of the following study plans:
Master of Chemistry: Analytical and Environmental Chemistry